Scanning Electron Microscopy

Scanning electron microscopy produces sharp, high-resolution, black-and-white images of samples. The outputs give researchers topographical, morphological and compositional information to support medical, biological, material sciences and engineering.

Scanning Electron Microscopy

Provides a broad range of surface imaging capabilities and elemental analysis for both conductive and non-conducting samples.

Supports medical, biological and material sciences.

Technical specifications

  • Field-emission electron source and advanced optics enable high resolution field-free imaging at low accelerating voltage with in-lens secondary electron (SE) detector
  • SE detector is used in field-free mode for comprehensive low to high magnification imaging of a variety of samples
  • Back scattered electron detector with a Bruker SDD EDS detector supports visualisation of compositional differences across the specimen surface
  • Bruker SDD EDS detector enables analysis of elements down to Boron (atomic number 5)
  • Variable-pressure (low vacuum) mode supports imaging of non-conductive and vacuum-sensitive specimens

Coming in December 2022

-   With a suite of state of-the-art technologies, this instrument is a multi-functional workstation designed to carry out ultra-high-resolution imaging (2D and 3D), microanalysis (2D and 3D), high quality TEM specimen preparation, nanoscale and micro-scale milling, deposition, and fabrication

Ideal for use in medical, biological, and material sciences.

Technical specifications

  • Ultra-high-resolution imaging below 1nm resolution in both 2D and 3D imaging
  • Wide array of detectors and advanced optics allowing high-contrast, field-free imaging at low accelerating voltages
  • A new generation of 2.5µA Xe plasma FIB ion column provides unique and fast ion milling capabilities (with 50x higher throughput compared to that in a Ga-based FIB)
  • Rapid cross-sectioning of technical specifications up to 900 µm.
  • Extended 3D analytical capabilities including EDS with FEI UltraDry 100M SDD EDS system
  • Equipped with an easy-lift micromanipulator for in-situ TEM and atom probe sample lift-out