Transmission electron microscope (TEM)
Transmission electron microscopes (TEMs) use a transmitted electron beam to discover information about materials at high magnification. This information can include imaging up to atomic level (TEM and HRTEM), identification and mapping of elemental composition using electron dispersion X-ray spectroscopy (EDS), and characterisation of crystal structures using selected area electron diffraction (SAED).
TEM samples are loosely divided into ‘soft’ and ‘hard’ matter, with a variety of preparation instruments and techniques applicable based on individual sample types within these subgroups. Soft matter usually includes biological and other organic samples, while hard matter may include synthesised samples and minerals, for example.
Sample requirements: TEM analysis of all samples types requires a very small sample size of <2um for individual particles or an ultra thin (< 100 nm) section of a biological specimen. Samples are accommodated on specific TEM grids. Samples must be non-magnetic. We strongly encourage users to discuss their samples and analytical requirements with EMX staff in advance, as sample preparation and analysis is highly specific and based on the nature of the sample.
JEOL TEM 2100
- High Resolution imaging capability with point resolution of 0.11 nm
- STEM/EDS analysis and EDS mapping
- Selected area electron diffraction (SAED) and nano beam diffraction (NBD)
- 200kV normal operating voltage
- Double tilting Beryllium specimen holder available if needed
- Well suited for hard specimen analysis
JEOL 1200 EXII TEM
- Normal resolution imaging capability with point resolution of 1 nm
- Selected area electron diffraction (SAED)
- SIA camera
- 80 Kv normal operating voltage with max capability of 120 Kv if needed
- Special designed objective aperture for enhanced contrast in imaging
- The low voltage and enhanced contrast settings of this instrument make it best suited to soft specimen, particularly biological specimen analysis