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The Electron Microscope and X-Ray Unit (EMX) provides a service to all university departments. It is located next to the Psychology Building on Architecture Way.
The unit has facilities for:
SEMS are used for imaging, elemental identification, quantification and mapping of a wide variety of sample types. SEMS in the EMX have been used to analyse many different sample types from bone fragments to organic electronic films to plant cells to catalysts to clays and minerals, to name just a few!
Transmission Electron Microscopes (TEMs) use a transmitted electron beam to discover information about materials at high magnification. This information can include imaging up to atomic level (TEM and HRTEM), identification and mapping of elemental composition using electron dispersion X‐ray spectroscopy (EDS), and characterisation of crystal structures using selected area electron diffraction (SAED).
X‐ray Diffraction (XRD) analysis is applicable only to crystalline materials and is most often used to determine the identity of phases or compounds in a sample. Most samples are powders, but the XRDs in the EMX are also able to analyse solid samples and thin films (glancing incidence).
Visit the Access page to find out how to register.