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Instrumentation

JEOL JEM-1200EXII TEM (1992)
+ digital imaging (2007)

Philips XL30 SEM
+ Oxford ISIS EDS (1997)

Philips X'Pert MPD XRD with 45 position sample changer/spinner, multipurpose sample stage and air atmosphere hot stage to 1600°C (2002), monochromator (2007)

Philips Diffractometer PW1710
+ autochanger (1983)

Spectro X'Lab 2000 Polarised ED-XRF with automatic sample changer (2002)

SPI Gold sputter coater
SPI Carbon coater

Balzers Critical Point Drier

Reichert Ultracut E ultramicrotome

Reichert Ultracut S ultramicrotome

Edwards Auto 306 evaporator

LKB 7800 glass knife maker

FUSILUX XRF specimen preparation machine